The Characterization of Effective Dielectric Constant in Low Temperature Co-fired Ceramic (LTCC) Fabrication Process for Development of Advanced Millimeter-Wave RF Front End Systems and Components

High frequency millimeter-waves are quickly becoming essential for many industrial and commercial applications including high resolution automotive radar and high-speed wireless communication systems. While millimeter-waves offer many benefits, they also introduce new engineering challenges, due to the smaller wavelengths and dielectric properties of materials at high frequencies. One of the primary challenges relates to the accurate characterization of the substrate material parameters, which are relied heavily upon in design and simulation of millimeter-wave circuits. Thin-film low temperature co-fired ceramics (LTCC) are a popular substrate choice for millimeter-wave circuits, allowing multiple metallization layers and accurate fabrication dimensions. Yet the accurate characterization of the electrical material parameters for LTCC have as yet not been extracted for millimeter-wave frequencies. The primary goal of this research is to accurately extract the effective dielectric constant and loss tangent of the as-fabricated material used in the LTCC process developed at ACAMP. TO BE CONT'D

Navid Hosseini
Faculty Supervisor: 
Mojgan Daneshmand
Partner University: