Design, fabrication and production of high aspect ratio diamond AFM probes
Atomic Force Microscopy (AFM) is one of the most widely used imaging tools by the researchers and industries to view and characterize tiny objects. This tool uses a very tiny and sharp probe to scan or feel the surface of the specimens and then it produces a topography image of the scanned surfaces. Since the probe is in a direct contact with these surfaces it wears off and becomes dull frequently. A more durable probe is desired to overcome this challenge, however at the current time more durable probes that are fabricated from diamond are very expensive and non practical, this research project aims to solve this problem.