Optimization of Flying Probe Testing Algorithms
The flying probe test is a standard method used to test circuit boards for defectiveness, using probes that are able to move and access various test points on the board. A circuit board consists of many electrical circuits, each of which has inputs and outputs. During a test, a probe is first placed on the input test point of a circuit, as it provides a voltage or current source to that circuit. Another probe is used to measure the corresponding output, monitoring whether or not the board produces expected values. Total testing time depends on the type of test being performed by the flying probes, as well as the accuracy, reliability of the measurements and the initial machine setup time. All these factors affect the way the probes are moved and we wish to model these behaviors (perhaps through linear or integer optimization) in hopes to optimize this system. Minimizing measurement errors as well as probe movements will drastically increase the rate at which individual boards are tested, thus speeding up the overall production process.