A continued optical function analysis for thin-film device structures

Informed thin-film device design, wherein layers of thin-films are deposited onto an underlying substrate, requires an understanding of the spectral dependence of the optical functions associated with the thin-film layers which constitute such a device. In this project, we aim to continue to develop our understanding of the form of the optical functions for the various types of thin-film materials and then use this knowledge in order to aid in the interpretation of experimentally acquired transmittance and reflectance spectra. We will start by continuing to expand, curate, and complete a library of optical functions corresponding to a plethora of thin-film materials. A series of models that aims to capture the underlying physicality captured in this library will be devised. We will then use these models in order to narrow the parameter space that must be probed in determining the spectral dependence of the optical functions associated with the thin-film layers from measurements of the transmittance spectrum at normal incidence and the reflectance spectrum at near-normal incidence. Finally, we aim to develop a protype software package that aims to capture the results of our investigations.

Faculty Supervisor:

Stephen O'Leary

Student:

Partner:

Solar Adventure Ltd;ESS Technology Inc

Discipline:

Engineering

Sector:

Professional, scientific and technical services; Utilities

University:

The University of British Columbia - Okanagan

Program: