Characterization of impurities in Cd1-xZnxTe-based alloys for radiation detection applications

Compound semiconductors are widely used in a variety of consumer products such as TVs, smartphones, lighting modules, as well as in high-performance applications, e.g. medical imaging. The reliability and performance of such devices strongly depends on the purity of the base materials. This project proposes a systematic investigation of the impact of the level and the nature of residual impurities in bulk crystals on their optoelectronic properties. These results will, in turn, be used to establish quantitative criteria for determining the suitability of specific purified materials for detector fabrication. This project will enable 5N Plus to acquire new expertise and to develop new experimental setups for advanced optoelectronics characterization. This will provide them with a competitive advantage for developing materials fulfilling their clients’ needs.

Faculty Supervisor:

Patrick Desjardins;Remo A Masut

Student:

Partner:

5N Plus Inc

Discipline:

Physics

Sector:

Manufacturing; Mining

University:

École Polytechnique de Montréal

Program: