Comparative study on stress measurement techniques in the context of protective alpha-Al2O3

Alpha-alumina is a material that is extensively used as an oxygen diffusion barrier in the aerospace industry, in the form of thin coatings. For optimal performances and to avoid coating failures, it is important to understand how mechanical stress is generated in alumina. This project will use piezo-spectroscopic luminescence to measure stress in alumina thin films produced by magnetron sputtering at Polytechnique Montreal. Expertise on the matter will be provided by Professor David Clarke, of Harvard. The technique allows for sensitive measurement of stress in alumina and provides micro-scale spatial resolution, which is not attainable with our own equipment. This method will then be compared against stress measurements previously performed with our own instruments and techniques (x-ray diffraction and Flexus measurements), to see if they are in agreement. TO BE CONT’D

Faculty Supervisor:

Jolanta Klemberg-Sapieha

Student:

Partner:

Harvard University

Discipline:

Engineering

Sector:

Education

University:

École Polytechnique de Montréal

Program: