An optical function analysis for thin-film device structures

Informed thin-film device design, wherein layers of thin-films are deposited onto an underlying substrate, requires an understanding of the spectral dependence of the optical functions associated with the thin-film layers which constitute such a device. In this project, we aim to further understand the form of the optical functions for the various types of thin-film materials and then use this knowledge in order to aid in the interpretation of experimentally acquired transmittance and reflectance spectra. We will start with the assembly of a library of optical functions corresponding to the various types of thin-film materials. A series of models that aims to capture this physicality will then be devised. Finally, we will use these models in order to narrow the parameter space that must be probed in determining the spectral dependence of the optical functions associated with the thin-film layers from measurements of the transmittance spectrum at normal incidence and the reflectance spectrum at near-normal incidence. The company sponsoring this project aims to commercialize a software offering capturing the results of this project. They also aim to exploit the results in order to develop new solar-based products.

Faculty Supervisor:

Stephen O'Leary

Student:

Kathrin Schmidt

Partner:

Solar Adventure Ltd

Discipline:

Engineering

Sector:

Other

University:

University of British Columbia