Measurement of carrier mobility and lifetime in blocking layers of a-Se X-ray detectors

The amorphous selenium (a-Se) based active matrix flat-panel imager (AMFPI) has demonstrated promising performance in breast imaging, exhibiting high image quality and dynamic range. However, sensitivity variation due to previous x-ray exposures, known as ghosting, is a common phenomenon in direct conversion detectors, which can lead to the incorrect interpretation of breast images for diagnosis and screening. The trapped charge carriers in the multi-layer a-Se detector are believed to be responsible for this ghosting phenomenon. In this project, the charge carrier lifetime in the different layers of the detector will be investigated and its effects on the ghosting phenomenon of the AMFPI will be determined.

Faculty Supervisor:

M. Zahangir Kabir

Student:

Partner:

Analogic Canada Corporation

Discipline:

Physics

Sector:

Wholesale trade

University:

Concordia University

Program: